E05700 - SEMI E57 - Specification for Kinematic Couplings Used to Align and Support 300 mm Wafer Carriers StdPbc-0314 4-95 (first published)

4-95 (first published)

The test method in this Standard uses APL test patterns with the APL specified for both the region under test and the background region to determine the APL contrast ratio

SEMI E5-0712 (technical revision)

4  The DCV sections of this Test Method refer to closed vessel microwave acid decomposition at elevated temperature and pressure

which is used in the semiconductor industry for the deposition of aluminium metal by vapor deposition techniques and aluminium oxide based layers by atomic layer deposition

E05700 - SEMI E57 - Specification for Kinematic Couplings Used to Align and Support 300 mm Wafer Carriers StdPbc-0314 4-95 (first published)This Standard was technically approved by the Physical Interfaces & Carriers Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 11, 2016. Available at www. semiviews. org and www. semi. org in June 2016; originally published in 1996; previously published November 2010. This Standard specifies the mechanical couplings used to ergonomically align and precisely support 300 mm wafer