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本スタンダードの目的は，材料もしくは装置に，危険な状態もしくは損傷の可能性をもたらすような隔離バルブの開閉を，防止することにある。
This course may be relevant to quality
SEMI C47-0706 (complete rewrite)
1-1124 (first published)
000 fabs anytime and anywhere
Semiconductor Metrology Instruments StdPbc-0311 本スタンダードの目的は，材料もしくは装置に，危険な状態もしくは損傷の可能性をもたらすような隔離バルブの開閉を，防止することにある。Course Description The THORS Semiconductor Metrology Instruments course introduces the learners to the various instruments used in semiconductor testing. This course focuses on wafer inspection instruments used in semiconductor testing. This course focuses on wafer inspection systems, which are used for identifying defects, and process control metrology instruments, which are used for measuring various aspects of semiconductor manufacturing processes.